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| Principle Specifications |  | - Measurement times*1, *2
| Range | Measurement speed (unit: ms) | | FAST | MED | SLOW | | 10 mΩ | 11 | 17 | 40 (47) | | 100 mΩ (1A) | 5.0 | 13 | 36 (43) | | 100 mΩ (100mA) | 3.8 | 13 | 36 (43) | | 1,000 mΩ | 2.0 | 6.4 | 35 (41) | | 10 Ω | 1.6 | 4.0 | 35 (41) | | 100 Ω | 1.6 | 4.0 | 35 (41) | | 1,000 Ω | 1.6 | 4.0 | 35 (41) |
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*1 When the measurement time varies with the power supply frequency, 60 Hz (50 Hz).
*2 The measurement time when averaging n times is given by (the above measurement time × n).
Example: The measurement time in the 10 mΩ range, SLOW mode, with 16 averaging iterations would be 640 (752) ms.
- Measurement accuracy (1-year accuracy at 23°C ±5°C, 80% RH or less)
Accuracy: ±(% rdg. +% f.s.) (calculated with f.s. = 1,000,000 dg., 0.001% f.s. = 10 dgt.)| Range | Max. display*1 | Resolution | FAST | MEDIUM | SLOW | 10 mΩ
(16 averaging iterations*3) | 12.00000 mΩ | 10 nΩ | 0.060+0.005 | 0.060+0.003 | 0.060+0.001*3 | | 10 mΩ | 0.060+0.002 | | 100 mΩ (1 A) | 120.0000 mΩ | 100 nΩ | 0.060+0.003 | 0.060+0.002 | 0.060+0.001 | | 100 mΩ (100 mA) | 120.0000 mΩ | 100 nΩ | 0.015+0.008 | 0.015+0.003 | 0.015+0.002 | | 1,000 mΩ | 120.0000 mΩ | 1 μΩ | 0.012+0.003 | 0.012+0.002 | 0.012+0.001 | | 10 Ω | 12.00000 Ω | 10 μΩ | 0.010+0.003 | 0.008+0.002 | 0.008+0.001 | | 100 Ω | 12.00000 Ω | 100 μΩ | 0.009+0.003 | 0.007+0.002 | 0.007+0.001 | | 1,000 Ω | 12.00000 Ω | 1 mΩ | 0.008+0.003 | 0.006+0.002 | 0.006+0.001 |
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| Range | Measurement current*2 | OVC | Open voltage | 10 mΩ
(16 averaging iterations*3) | 1 A | ON | Max. 20 V *4, *5 | | 10 mΩ | | 100 mΩ (1 A) | 1 A | ON | | 100 mΩ (100 mA) | 100 mA | ON | | 1,000 mΩ | 100 mA | ON | | 10 Ω | 10 mA | ON | | 100 Ω | 10 mA | ON | | 1,000 Ω | 1 mA | ON |
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*1 Positive values up to 10% of positive full scale.
*2 Measurement current precision ±5%.
*3 When averaging is enabled with at least 16 iterations (defined for SLOW mode operation in the 10 mΩ range only; otherwise, no dependence on averaging settings).
*4 In PULSE current mode with the contact improvement function off and PULSE settings of 20 mV or less during non-measurement (for measurement with a voltmeter with an input resistance of 10 MΩ).
*5 The total acceptable measurement cable, measurement target, and contact resistance will be less than the open voltage/measurement current. For example, with a measurement current of 1 A, the instrument can measure of a total of up to 2 Ω for the measurement cable, measurement target, and contact resistance.
- Basic Specifications
| Operating temperature and humidity range | 0°C to 40°C, 80% RH or less (non-condensing) | | Storage temperature and humidity range | -10°C to 50°C, 80% RH or less (non-condensing) | | Operating location | Indoors, pollution level 2, elevation of 2,000 m or less | | Rated supply voltage | 100 to 240 VAC ±10% | | Rated power supply frequency | 50/60 Hz | | Rated power | 40 VA | | External dimensions | Approx. 260 (W) × 88 (H) × 300 (D) mm (excluding protruding parts) | | Weight | Approx. 3.0 kg | | Standard compliance | Safety: EN 6101
EMC: EN 61326 , EN 61000-3-2, EN 61000-3-3 |
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Features
(October 2011, Nagano, Japan) HIOKI E.E. CORPORATION is pleased to announce the launch of the RM3543 and RM3543-01, a pair of ohmmeters that are particularly well-suited for use in measuring low-ohmic resistors. Shunt resistors, which are employed when measuring current on high-current circuits, are frequently used in power supply management and battery management, and they play an important role in applications such as electric vehicle development. Shunt resistors are also used as resistive elements in order to improve safety in applications such as overvoltage detection. Currently, the trend in shunt resistor development is toward higher precision, lower resistance, and smaller size, and the market is expected to grow in the future. HIOKI is proud to launch the RM3543 series in response to heightened need on the part of manufacturers to measure shunt resistors on production lines at high levels of speed and precision. High precision is particularly important when testing low-ohmic resistors. The RM3543 series can measure shunt resistors with a precision of 0.1 mΩ ±1% at a high accuracy of ±0.16% (when using its averaging function; see below). When conducting shipping inspections on a production line, the manufacturer must prevent defective parts from being delivered to the market when measurement pins fail to establish good contact with the device under test. The RM3543 series reduces the likelihood of false negatives with enhanced contact functionality for measuring shunt resistance in a reliable manner. The RM3543 series, which is designed to be embedded in automated equipment, complies with the international standard on electromagnetic compatibility (EMC) in order to minimize the effect of electromagnetic interference from nearby production equipment. | |
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| RM3543 Series Applications | | - Measurement and testing of shunt resistance and other DC resistance characteristics
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| RM3543 Series features | | - Measure 0.1 mΩ at a high accuracy of ±0.16%
A high degree of precision is required when conducting shipping inspections of shunt resistors on the order of 0.1 mΩ. The RM3543(-01)’s averaging function allows measurement of shunt resistance that has a precision of 0.1 mΩ ±1% at an accuracy of ±0.16% and resolution of 0.01 mΩ.
Averaging function: Functionality for eliminating variations in measured shunt resistance values by taking multiple measurements and calculating the average value, thereby yielding a more stable reading.
- Enhanced contact function for preventing unreliable results during shipping inspections
When conducting shipping inspections on a production line, the manufacturer must prevent defective parts from being shipped to the market when measurement pins fail to establish good contact with the device under test. HIOKI has incorporated a number of enhanced contact functions into the instrument to ensure that shunt resistance can be measured reliably, thereby preventing false negatives.
One of these functions, the Contact Improver function, temporarily removes any oxide film or dirt that has accumulated between the probes and the device under test. Using this function helps to decrease the contact defect rate, contributing to improved productivity.
The Voltage Monitor function treats significant fluctuations in the voltage detected during measurement, which are caused by factors such as fluctuations in the current pin’s contact resistance, as errors, and increasing the reliability of the measured values.
Where previous HIOKI models performed contact checks before and after measurement, the RM3543(-01) adds contact check processing during measurement to enable high-speed, high-reliability operation.
- Compliance with the international standard on EMC, allowing the instrument to be embedded in automated equipment
The RM3543(-01) is designed to be embedded in automated equipment. Reflecting consideration given to the effects of electromagnetic interference from nearby production equipment, the instrument complies with the international standard on EMC (IEC 61326). Strict compliance to standards minimizes the effects of electromagnetic interference on measured values.
- Save 30,000 data points thanks to a memory function and high-speed data output capability
The RM3543(-01)’s memory function enables it to save 30,000 data points. Furthermore, the instrument can generate high-speed data output from its RS-232C (2 ms) or GP-IB (1 ms) interface. The benefits are clear: test data can be analyzed with optimum efficiency.
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