• Family of products offers wide dynamic range: 10pA to 10A, 1µV to 1100V, 20W to 1000W
• 4-quadrant operation
• 0.012% basic accuracy with 5-1/2-digit resolution
• 6-wire Ù measurement with programmable I source and V clamp
• 1700 readings/second at 4-1/2 digits via GPIB
• Built-in comparator for fast pass/fail testing
• Optional contact check function
• Digital I/O for fast binning and connection to component handlers
• GPIB, RS-232, and Trigger Link interfaces
• TestPoint^™ and LabVIEW^® drivers

Keithley's SourceMeter family is designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as measurement capabilities. Each SourceMeter instrument is both a highly stable DC power source and a true instrument-grade 5-1/2 digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single-channel, DC parametric tester. In operation, these instruments can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter. Manufacturers of components and modules for the communications, semiconductor, computer, automotive, and medical industries will find the SourceMeter instruments invaluable for a wide range of characterization and production test applications.

Our Model 2410 High Voltage SourceMeter® is a 20W instrument that sources and measures voltage from ±5µV (source) and ±1µV (measure) to ±1100V and current from ±10pA to ±1A. With its higher voltage sourcing range, the Model 2410 is an excellent choice for resistors and voltage coefficient testing, varistors, and high voltage diodes, including switching, zener, RF diodes, and rectifiers. The Model 2410 is able to measure 20mA while sourcing 1100V, providing the extra resolution needed for precision testing of these devices.

• Devices:
• Discrete semiconductor devices
• Passive devices
• Transient suppression devices
• ICs, RFICs, MMICs
• Laser diodes, laser diode modules, LEDs, photodetectors
• Circuit protection devices: TVS, MOV, Fuses, etc.
• Airbags
• Connectors, switches, relays
• Tests:
• Leakage
• Low voltage/resistances
• LIV
• IDDQ
• I-V characterization
• Isolation and trace resistance
• Temperature coefficient
• Forward voltage, reverse breakdown, leakage current
• DC parametric test
• DC power source
• HIPOT
• Dielectric withstanding