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Keithley 2636B System Sourcemeter - Dual Channel, (0.1fA, 200V, 1.5A DC/ 10A Pulse), Low Current

Keithley 2636B System Sourcemeter - Dual Channel, (0.1fA, 200V, 1.5A DC/ 10A Pulse), Low Current
Keithley 2636B System Sourcemeter - Dual Channel, (0.1fA, 200V, 1.5A DC/ 10A Pulse), Low Current
 
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Our Price: $18,585.00 USD


Availability: 4 to 6 weeks
Product Code: 2636B

Description
 
Features
  • Source/Measure Capabilities

  • Dual channel model with 60W power
    output (30W/channel)
  • 4 quadrant source/measure with
    6˝ digit resolution
  • Current Max/Min: 1.5A DC,10A pulse/0.1fA
  • Voltage Max/Min: 200V/100nV
  • General Features

  • Built-in "Plug & Play" Java-Based I-V
    characterization and test software
  • TSP® (Test Script Processing) technology
    embeds complete test programs
    inside the instruments
  • TSP-Link® expansion technology for
    multi-channel parallel test
  • Software emulation for Keithley's Model
    2400 SourceMeter® SMU Instrument
  • Large, easy-to-read, dual line display

The Model 2636B SourceMeter® SMU instrument, part of the Series 2600B SourceMeter SMU Instruments family, is a new and improved two-channel SMU instrument with a tightly integrated four-quadrant design that allows it to simultaneously source and measure both voltage and current to boost productivity in applications ranging from R&D to automated production test. The wide range of 1.5A DC, 10A pulse, 200V, and 0.1fA measurement resolution output makes it ideal to test a wide range of lower current devices and materials. In addition to retaining all the features of the Model 2636A, the Model 2636B has 6˝-digit resolution, USB 2.0 connectivity, and software command emulation of the Model 2400 SourceMeter SMU Instrument that enables easy migration of legacy test code. The Model 2636B is equipped with Keithley's high speed TSP® technology (over 190% faster than traditional PC-to-instrument communication techniques,) which dramatically improves the system-level speed to lower the cost of test. The TSP-Link® interface enables multi-channel parallel test and expands the test system without the cost of a mainframe.

I-V capability Current measurement resolution of 2635B is 10 times better than that of the closest competitive SMU


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