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| Basic specifications (Accuracy guaranteed for 1 year) |  |
| | IM3533 | IM3533-01 | | Measurement modes | LCR, Transformer testing (N, M, ΔL), Continuous testing (LCR mode) | LCR, Transformer testing (N, M, ΔL), Analyzer (sweep testing), Continuous Testing (LCR/ Analyzer mode) | | Measurement parameters | Z, Y, θ, Rs (ESR), Rp, DCR (DC resistance), X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q, N, M, ΔL, T | | Measurement range | 100mΩ to 100MΩ, 10 ranges (All parameters defined in terms of Z ) | | Displayable range | Z, Y, Rs, Rp, Rdc, X, G, B, Ls, Lp, Cs, Cp : ± (0.000000 [unit] to 9.999999G [unit]) Real value display for Z and Y only
θ: ± (0.000° to 999.999°), D: ± (0.000000 to 9.999999)
Q: ± (0.00 to 99999.99), Δ%: ± (0.0000% to 999.9999%) | | Basic accuracy | Z : ±0.05%rdg. θ: ±0.03° | | Measurement frequency | 1mHz to 200kHz (1mHz to 10Hz steps) | | Measurement signal level | [Normal mode]
V mode, CV mode: 5 mV to 5 Vrms, 1 mVrms steps
CC mode: 10 μA to 50 mArms, 10 μArms steps
[Low impedance high accuracy mode]
V mode, CV mode: 5 mV to 2.5 Vrms, 1 mVrms step
CC mode: 10 μA to 100 mArms, 10 μArms steps | | Output impedance | Normal mode: 100 Ω, Low impedance high accuracy mode: 25 Ω | | Display | 5.7-inch touch-screen color TFT, display can be set to ON/OFF | | Measurement time | 2 ms (1 kHz, FAST, display OFF, representative value) | | Functions | DC bias measurement, DC resistance temperature compensation
(converted reference temperature display), Comparator, BIN
measurement (classify function), Panel loading/saving, Memory function | | Interface | EXT I/O (Handler), USB communication (high-speed), USB memory
Optional: Choose 1 from RS-232C, GP-IB, or LAN | | Power supply | 100 to 240 V AC, 50/60 Hz, 50 VA max | | Dimensions, mass | 330 mm (12.99 in) W × 119 mm (4.69 in) H × 168 mm (6.61 in) D, 3.1 kg (109.3 oz) | | Supplied accessories | Power cord ×1, Instruction Manual ×1, CD-R (Includes PC commands and sample software) ×1 |
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Features
 Test Tweezers
| Performance | | | All three instruments build on the capabilities of previous models to set a new standard of performance. The IM3523 delivers exceptional convenience when used on electronic component production lines, while the IM3533 augments the IM3523’s features with functions designed to accommodate testing of transformers and induction coils. Finally, the IM3533-01 expands the capabilities of the IM3523 and IM3533 by adding extensive functionality for use in research and development applications. | |
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| Advanced Features in the Series | | - Broad measurement frequency, voltage, and current ranges, accommodating an expanded array of applications
All three instruments offer expanded measurement frequency and measurement signal ranges compared to previous models. These increases allow the devices to be used in a more extensive range of measurement applications while delivering a higher level of operator convenience.| | IM3523 | IM3533 | IM3533-01 | 3522-50 (previous model) | | Measurement frequency | 40 Hz to 200 kHz | 1 mHz to 200 kHz | 1 mHz to 100 kHz | | Measurement voltage | 5 mV to 5 V | Normal: 5 mV to 5 V
Low Z high accuracy mode: 5 mV to 2.5 V | 10 mV to 5 V | | Measurement current | 10 mA to 50 mA | Normal: 10 mA to 50 mA
Low Z high accuracy mode: 10 mA to 100 mA | 10 mA to 100 mA |
- Improved basic accuracy of ±0.05%
All three instruments deliver basic accuracy of ±0.05% of reading for Z (impedance)* measurement. This improvement over the performance of previous models (which delivered ±0.08% of reading accuracy) allows the new models to take more accurate measurements.
*Z (impedance): Resistance in an AC circuit.
- Increased measurement efficiency with measurement times of half or less previous models’ numbers
The IM3523 takes just 2 ms to perform measurements that took 5 ms (1 ms = 1/1,000 s) with previous models, dramatically boosting measurement efficiency. The instrument is particularly effective when used in a production-line setting, where its shorter measurement times translate into lower costs.
- Contact check functionality for reduced risk of undetected defects
The instruments’ contact check functionality detects broken wires and poor contact with samples during measurement, reducing the risk of undetected defects to enable higher-reliability measurement.
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| Instrument-specific Features | | - IM3523
(1) Compact, lightweight design that is easily embedded in production line equipment The IM3523 is about 40% smaller than previous models in terms of installation area and about 20% lighter, making it easy to set aside enough space to install the instrument on production lines or inside automated testing equipment.
- IM3533
The IM3533 augments the IM3523’s functionality with the following features:
(1) Functionality for measuring targets such as windings, induction coils, and transformers, accommodating a broader range of applications The IM3533 provides functionality that is well suited to the measurement of targets such as windings, induction coils, and transformers. DCR measurement with a temperature correction function is supported for windings and transformers, and the instrument’s support for internal DC bias measurement (within a ±5 V range) is useful when measuring tantalum and other polarized capacitors. The ability to measure specific components allows the IM3533 to perform a broader range of measurements.
(2) Touch panel for improved operability
The IM3533’s touch panel provides improved operability.
- IM3533-01
The IM3533-01 further augments the functionality of the IM3523 and IM3533 with the following feature, which is particularly well suited to research and development applications.
(1) Frequency sweep function, ideal for use by research and development departments
The IM3533-01’s frequency sweep function, which lets the user observe measurement variations at each frequency in a specified range, is an effective tool for research and development departments as they assess the characteristics of electronic components. Measurement results can be saved on computers and other devices via a USB memory stick or other interface, allowing data for each frequency point to be analyzed.
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